Progress Towards More Realistic In-Situ Microscopy Observations

Abstract

As progress indicators in electron microscopy, advances in spatial resolution and in spectroscopy probably attract most frequent attention. Improved user-friendliness has also been significant even when judged in comparison with scanned probe microscopy. Evidence for developments in in-situ microscopy at least equally impressive can be found by comparing the relevant sections of the book by Hirsch et al. and a more recent compilation.Peter Hirsch's research group swiftly discovered the power and frustrations of in-situ microscopy. The cine film of dislocation motion observed in the earliest diffraction contrast studies, and attributed to the thermal stresses generated by the electron beam, was extremely effective in convincing the wider community that it was indeed dislocations that were being observed.