Author:
Montgomery Eric,Leonhardt Darrin,Roehling John
Abstract
Abstract:With the growing applications of temporally resolved electron microscopy for
probing basic phenomena and reducing beam-induced damage, a multifaceted
introduction to the field of ultrafast transmission electron microscopy is
provided. This primer includes techniques and equipment as well as
implementation perspectives. Historical developments and recent technical
advances will provide insight into ultrafast capabilities for research as well
as educate electron microscopists on the general techniques. This technology
review also includes applications enabled by ultrafast techniques using various
sample stimuli from multidisciplinary fields.
Publisher
Cambridge University Press (CUP)
Cited by
10 articles.
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