Evaluation of STEM-in-SEM vs. TEM for Polymer Applications in an Industrial Setting-Reference-Cited by-同舟云学术

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Evaluation of STEM-in-SEM vs. TEM for Polymer Applications in an Industrial Setting

Published:2008-08 Issue:S2 Volume:14 Page:678-679
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Guise O,Strom C,Preschilla N

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. STEM-in-SEM: A Re-Emerging Material Measurement Approach;Microscopy and Microanalysis;2021-07-30

2. Gold-coated plant virus as computed tomography imaging contrast agent;Beilstein Journal of Nanotechnology;2019-10-07

3. STEM-in-SEM high resolution imaging of gold nanoparticles and bivalve tissues in bioaccumulation experiments;The Analyst;2015

4. Dark-Field Imaging of Thin Specimens with a Forescatter Electron Detector at Low Accelerating Voltage;Microscopy and Microanalysis;2013-08-28

5. STEM mode in the SEM: A practical tool for nanotoxicology;Nanotoxicology;2010-11-19

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