Vector Piezoresponse Force Microscopy-Reference-Cited by-同舟云学术

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Vector Piezoresponse Force Microscopy

Published:2006-05-16 Issue:03 Volume:12 Page:206-220
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc. Microanal.

Author:

Kalinin Sergei V.,Rodriguez Brian J.,Jesse Stephen,Shin Junsoo,Baddorf Arthur P.,Gupta Pradyumna,Jain Himanshu,Williams David B.,Gruverman Alexei

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference33 articles.

1. Principle of ferroelectric domain imaging using atomic force microscope

2. The Importance of Distributed Loading and Cantilever Angle in Piezo-Force Microscopy

3. Nanoscale reconstruction of surface crystallography from three-dimensional polarization distribution in ferroelectric barium–titanate ceramics

4. Calibration of frictional forces in atomic force microscopy

5. Nondestructive imaging and characterization of ferroelectric domains in periodically poled crystals

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