An Energy Filter for Electron Backscattering Diffraction-Reference-Cited by-同舟云学术

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An Energy Filter for Electron Backscattering Diffraction

Published:2004-08 Issue:S02 Volume:10 Page:938-939
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Hooghan T K,Staib Philippe,Eades Alwyn

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Capabilities of a New Compact SEM / STEM Electron Detector for Energy Resolved Scanning Imaging, Reflection Electron Energy Loss Spectroscopy (REELS) and Elastic Peak Electron Spectroscopy (EPES);Microscopy and Microanalysis;2023-07-22

2. A Low Electron Voltage Approach to Increase Spatial Resolution of Temperature Mapping in Thermal Scanning Electron Microscopy;MRS Proceedings;2013

3. Energy Filtering in EBSD;Electron Backscatter Diffraction in Materials Science;2009

4. Energy-filtered electron backscatter diffraction;Ultramicroscopy;2008-01

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