Scanning Ion Conductance Microscopy (SICM) for Low-stress Directly Examining of Cellular Mechanics
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference8 articles.
1. Scanning ion conductance microscopy of living cells
2. Mapping the mechanical stiffness of live cells with the scanning ion conductance microscope
3. Low Stress Ion Conductance Microscopy of Sub-Cellular Stiffness
4. Novel method for rapid toxicity screening of magnetic nanoparticles
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Latest Advances in Scanning Ion-Conductance Microscopy and Nanopipette Systems for Single-Cell Analysis under Serial Conditions;Seriya 3: Fizika, Astronomiya;2023-12-19
2. Latest Advances in Scanning Ion-Conductance Microscopy and Nanopipette Systems for Single-Cell Analysis under Serial Conditions;Moscow University Physics Bulletin;2023-12
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