Development of Clustering Algorithm Applied for the EELS Analysis of Advanced Devices-Reference-Cited by-同舟云学术

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Development of Clustering Algorithm Applied for the EELS Analysis of Advanced Devices

Published:2020-07-30 Issue:S2 Volume:26 Page:2112-2114
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Chang Mu-Tuhg,Cai Ren-Fong,Chen Chien-Chun,Lo Shen-Chuan

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference3 articles.

1. 2. Raschkaand, S. , Mirjalili, V. , Python Machine Learning:Machine Learning and Deep Learning with Python, scikit-learn, and Tensor Flow 2ndED, Packt, Birmingham (2017).

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopy;Scientific Reports;2023-08-22

2. Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook;Nanoscale Horizons;2022

3. WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS;Ultramicroscopy;2022-01

4. Strategies for EELS Data Analysis. Introducing UMAP and HDBSCAN for Dimensionality Reduction and Clustering;Microscopy and Microanalysis;2021-11-22

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