Energy Analyzer Attachments for the Scanning Electron Microscope
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference16 articles.
1. A comparison of voltage contrast detectors
2. The authors acknowledge funding under the Singapore Government MOE 2011-T2-2-108 grant.
3. High resolution quantitative two-dimensional dopant mapping using energy-filtered secondary electron imaging
4. Transmission EELS Attachment for SEM
5. LORENTZ-2EM, Integrated Engineering Software Inc., Canada.
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