Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques-Reference-Cited by-同舟云学术

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Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

Published:2013-08 Issue:S2 Volume:19 Page:718-719
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Poplawsky J.,Li C.,Paudel N.,Yan Y.,Pennycook S.

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Large Area Survey Grain Size and Texture Optimization For Thin Film CdTe Solar Cells Using Xenon-Plasma Focused Ion Beam (PFIB);2022 IEEE 49th Photovoltaics Specialists Conference (PVSC);2022-06-05

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