Correlative UHV-Cryo Transfer Suite: Connecting Atom Probe, SEM-FIB, Transmission Electron Microscopy via an Environmentally-Controlled Glovebox
Author:
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference7 articles.
1. Enabling Atom Probe Analyses of New Materials Classes with Vacuum-Cryo-Transfer Capabilities
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4. Methods in Creating, Transferring, & Measuring Cryogenic Samples for APT
5. Atom Probe Tomography Study of As-Quenched Al-Mg-Si Alloys
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