Spectral Map Reconstruction Using Pan-Sharpening Algorithm: Enhancing Chemical Imaging with AFM-IR

Author:

Borodinov Nikolay,Bilkey Natasha,Foston Marcus,Ievlev Anton V.,Belianinov Alex,Jesse Stephen,Vasudevan Rama K.,Kalinin Sergei V.,Ovchinnikova Olga S.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference3 articles.

1. The authors acknowledge the Center for Nanophase Materials Sciences, which is a US DOE Office of Science User Facility supported under Contract DE-AC05-00OR22725, (N.B., A.V.I, A.B., S.V.K, O.S.O). A portion of algorithm development was a part of the AI Initiative, sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (S.J., R.K.V), managed by UT-Battelle, LLC, for the U.S. Department of Energy (DOE). The plant sciences portion of this work was supported by the Center for Engineering MechanoBiology (CEMB), an NSF Science and Technology Center, under grant agreement CMMI: 15-48571 (N.B. and M.F.).

2. Correlated Materials Characterization via Multimodal Chemical and Functional Imaging

3. AFM-IR: Technology and Applications in Nanoscale Infrared Spectroscopy and Chemical Imaging

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