Quantitative Assessment of TEM-Sample Warping Caused by FIB Preparation-Reference-Cited by-同舟云学术

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Quantitative Assessment of TEM-Sample Warping Caused by FIB Preparation

Published:2010-07 Issue:S2 Volume:16 Page:172-173
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Salzer R,Graff A,Simon M,Altmann F

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Warp-Free TEM Sample Preparation Methods Using FIB/SEM Systems;Microscopy and Microanalysis;2022-12-01

2. Warp Free TEM Sample Preparation Methods Using FIB/SEM Systems;Microscopy and Microanalysis;2021-07-30

3. Practical aspects of the use of the X2 holder for HRTEM-quality TEM sample preparation by FIB;Ultramicroscopy;2014-12

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