An Introduction to Helium Ion Microscopy-Reference-Cited by-同舟云学术

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An Introduction to Helium Ion Microscopy

Published:2006-07-31 Issue:S02 Volume:12 Page:126-127
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Notte J,Hill R,McVey S,Farkas L,Percival R,Ward B

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

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