Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP-Reference-Cited by-同舟云学术

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Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP

Published:2006-07-31 Issue:S02 Volume:12 Page:1720-1721
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Gorman B,Diercks D,Kaufman M,Ulfig R,Lawrence D,Thompson K,Larson D

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

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