Influence of Annealing Temperature on the Microstructural and Electrical Characteristics of MgZnSnO Channel Layers for Thin Film Transistors
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Published:2014-12-05
Issue:12
Volume:52
Page:1009-1015
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ISSN:1738-8228
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Container-title:Korean Journal of Metals and Materials
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language:
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Short-container-title:Korean J. Met. Mater.
Author:
Lee Ho Seong,Kim Ho Beom
Publisher
The Korean Institute of Metals and Materials
Subject
Metals and Alloys,Surfaces, Coatings and Films,Modeling and Simulation,Electronic, Optical and Magnetic Materials