A Study of Silicon Crystallization Dependence upon Silicon Thickness in Aluminum-induced Crystallization Process-Reference-Cited by-同舟云学术

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A Study of Silicon Crystallization Dependence upon Silicon Thickness in Aluminum-induced Crystallization Process

Published:2018-05-31 Issue:5 Volume:56 Page:400-405
ISSN:1738-8228
Container-title:Korean Journal of Metals and Materials
language:en
Short-container-title:Korean J. Met. Mater.

Author:

Lee Doo Won,Bhopal Muhammad Fahad,Lee Soo Hong

Publisher

The Korean Institute of Metals and Materials

Subject

Metals and Alloys,Surfaces, Coatings and Films,Modeling and Simulation,Electronic, Optical and Magnetic Materials

Link

http://kjmm.org/upload/pdf/KJMM-2018-56-5-400.pdf

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Si/4H–SiC heterostructure formation using metal-induced crystallization;Materials Science in Semiconductor Processing;2021-06

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