Moiré Analysis for Assessment of Line Registration Quality
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Published:2007-07-01
Issue:4
Volume:51
Page:310-316
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ISSN:1062-3701
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Container-title:Journal of Imaging Science and Technology
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language:
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Short-container-title:jist
Author:
Rawashdeh Nathir,Lau Daniel,Love Shaun,Donohue Kevin
Publisher
Society for Imaging Science & Technology
Subject
Computer Science Applications,Atomic and Molecular Physics, and Optics,General Chemistry,Electronic, Optical and Magnetic Materials