High-density genetic mapping of a major QTL for resistance to multiple races of loose smut in a tetraploid wheat cross-Reference-Cited by-同舟云学术

High-density genetic mapping of a major QTL for resistance to multiple races of loose smut in a tetraploid wheat cross

Published:2018-02-27 Issue:2 Volume:13 Page:e0192261
ISSN:1932-6203
Container-title:PLOS ONE
language:en
Short-container-title:PLoS ONE

Author:

Kumar Sachin,Knox Ron E.,Singh Asheesh K.,DePauw Ron M.,Campbell Heather L.,Isidro-Sanchez Julio,Clarke Fran R.,Pozniak Curtis J.,N’Daye Amidou,Meyer Brad,Sharpe Andrew,Ruan Yuefeng,Cuthbert Richard D.,Somers Daryl,Fedak George

Funder

Genome Canada

Western Grains Research Foundation

Agriculture and Agri-Food Canada

Publisher

Public Library of Science (PLoS)

Subject

Multidisciplinary

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4. Testing for resistance to smut diseases of barley, oats and wheat in western Canada;JG Menzies;Can J Plant Pathol,2009

5. Bunt and smut disease of wheat: concepts and methods of disease management;RR Wilcoxson,1996

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