Advancements in FR4 dielectric analysis: Free space approach and measurement validation

Abstract

In this study, the free space approach is utilized to calculate the relative permittivity of FR4 by utilizing the Nicholson-Ross-Weir Conversion. By examining the scattering characteristics, the free space technique offers a practical tool for describing dielectric materials. The simulations were run on CST-2019, and the frequency range of 8.5 GHz to 11.5 GHz was chosen. Experimental measurements were carried out utilizing a Vector Network Analyzer, To further reduce outside influences and assure accurate measurements in a controlled setting, an anechoic chamber was used. The outcomes of the simulations and actual measurements show the significance of the Nicholson- Ross-Weir Conversion and free space approach in calculating the relative permittivity of FR4. The correctness and dependability of the suggested technique are confirmed by the good agreement between the simulated and measured outcomes. This study makes a contribution to the field of electromagnetic characterization and offers a useful method for figuring out FR4’s dielectric characteristics. The results of this study have substantial effects on PCB design and optimization as well as other high-frequency electronic devices that operate in the frequency band under consideration.