Abstract
Abstract
Many studies about the multilayer coating have indicated the effects of reflection phase, reflection group delay (GD), and reflection group delay dispersion (GDD) characteristics. Some overlook the importance of studying complex statistical coefficients and their role in comparing the results of optical designs and realize how important information is in analyzing data. In statistics, one can learn various techniques for working with data. This paper goes into a detailed study of multilayer stacks’ dispersive properties for two mirror designs depending on MATLAB programs based on statistical parameters to evaluate the reflectance for the ZnS/MgF$${}_{2}$$ mirror. Two samples with a quarter wavelength optical thickness were prepared, specially designed for 632.8 nm He-Ne laser mirrors. For the designed mirror, the value of the reflectivity of the thirteen-layer ZnS/MgF$${}_{2}$$ mirror is 99.34$$\%$$, while for the seven-layer ZnS/MgF$${}_{2}$$ mirror is 96.57$$\%$$. This study presents greater detail on statistics and realized data topics when designing multilayer coating, including mean, median, mode, and standard deviation (STD). The reliability and accuracy of the data can be verified by calculating the standard deviation.
Reference18 articles.
1. J. W. Goodman, Introduction to Fourier Optics (Englewood, Colo., 2005).
2. T. N. Georoes, A. Rola, and W. Loganf, Analog and Digital Holography with MATLAB (SPIE Press, Bellingham, Wash., 2015).
3. W. Wang and M. Takeda, ‘‘Optical transfer matrix: matrix correlation as frequency domain analysis of polarization imaging system,’’ Proc. SPIE 12126, 121261Y (2021). https://doi.org/10.1117/12.2616423
4. M. Takeda, H. Ina, and S. Kobayashi, ‘‘Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry,’’ J. Opt. Soc. Am. 72, 156–160 (1982). https://doi.org/10.1364/josa.72.000156
5. M. Takeda, ‘‘Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview,’’ Ind. Metrol. 1, 79–99 (1990). https://doi.org/10.1016/0921-5956(90)80019-r