1. I. V. Sabinina, “Structure Defects in CdxHg1−xTe Films Grown by the Method of Molecular Beam Epitaxy,” Abstract of Candidate’s Dissertation (Novosibirsk, 2006).
2. P. A. Bakhtin, V. S. Varavin, S. A. Dvoretskii, et al., “Anisotropy of Conductivity of CdxHg1-xTe Films with a Periodic Surface Microrelief grown by the Method of Molecular Beam Epitaxy,” Avtometriya, No. 2, 83–91 (2002).
3. Temperature Measurement: Reference Book, Ed. by O. A. Gerashchenko, A. N. Gordov, A. K. Eremina, et al. (Naukova Dumka, Kiev, 1989) [in Russian].
4. A. N. Magunov, Laser Thermometry of Solids (Fizmatlit, Moscow, 2001) [in Russian].
5. T. Yamaguchi, M. Ohkubo, N. Ikeda, and T. Nomura, “Measurement of Semiconductor Surface Temperature using Raman Spectroscopy,” Furukawa Rev., No. 18, 73–77 (1999).