1. Pikhtin, N.A., Sliptchenko, S.O., Sokolova, Z.N., and Tarasov, I.S., Analysis of threshold current density and optical gain in InGaAsP quantum well lasers, Semiconductors, 2002, vol. 36, pp. 344–353. https://doi.org/10.1134/1.1461415
2. Starostenko, V.V., Taran, E.P., Gribskii, M.P., Churyumov, G.I., and Tribrat, M.I., Numerical calculation of dynamics of electrothermal processes in conductive structures of modern microcircuits under influence of electromagnetic fields, ASU Prib. Avtomatiki, 2007, no. 139, pp. 13–17.
3. Wilson, W.E., Angadi, S.V., and Jackson, R.L., Electrical contact resistance considering multi-scale roughness, 2008 Proc. 54th IEEE Holm Conf. on Electrical Contacts, Orlando, Fla., 2008, IEEE, 2008, pp. 190–197. https://doi.org/10.1109/holm.2008.ecp.43
4. White, F.M., Heat Transfer, Boston: Addison-Wesley, 1984.
5. Bergman, T.L., Incropera, F.P., and Lavine, A.S., Fundamentals of Heat and Mass Transfer, Wiley, 2011.