Allowing for matrix effects in local electron-probe analysis using a new model of the distribution function for the depth of characteristic X-ray radiation

Author:

Mikheev N. N.,Stepovich M. A.,Shirokova E. V.

Publisher

Allerton Press

Subject

General Physics and Astronomy

Reference14 articles.

1. Fizicheskie osnovy rentgenospektral’nogo lokal’nogo analiza (Physical Foundations of X-Ray Local Analysis), Borovskii, I.B., Ed., Moscow: Nauka, 1973.

2. Elektronnozondovyi mikroanaliz (Electron Probe Microanalysis), Borovskii, I.B., Ed., Moscow: Mir, 1974.

3. Reed, S.J.B., Electron Probe Microanalysis, London: Chapman & Hall 1995; Moscow: Mir, 1979.

4. Love, G., Scott, V.D., Reed, S.J.B., et al., Quantitative Electron-Probe Microanalysis, New York: Wiley & Sons, 1983; Moscow: Mir, 1986.

5. Afonin, V.P., Zh. Anal. Khim., 1991, vol. 46, no. 2, p. 230.

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