Author:
Morozov S. N.,Rasulev U. Kh.
Subject
General Physics and Astronomy
Reference19 articles.
1. Jacguet, D. and Le Beyec, Y., Nucl. Instrum. Methods Phys. Res., Sect. B, 2002, vol. 193, p. 227.
2. Van Stipdonk, M.J., in TOF-SIMS: Surface Analysis by Mass Spectrometry, Vickerman, J.C. and Briggs, D., Eds., Huddersfield: IM Publ. and Surface Spectra, 2001, p. 309.
3. Mahoney, C.M., Roberson, S.V., and Gillen, G., Anal. Chem., 2004, vol. 76, p. 3199.
4. Winograd, N., Anal. Chem., 2005, vol. 77, p. 142.
5. Stapel, D. and Beninghoven, A., Appl. Surf. Sci., 2001, vol. 174, p. 261.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Sputtering of GaAs target under Bi+ cluster ions bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-10
2. On the Sputtering of Copper Phthalocyanine Molecules on a GaAs Substrate under Bombardment with Multiply Charged Ions;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2021-03