1. Novikov, G.F., Rabenok, E.V., and Gapanovich, M.V., Semiconductors, 2010, vol. 44, no. 5, p. 575.
2. Luschitz, J., Siepchen, B., Schaffner, J., et al., Thin Solid Films, 2009, vol. 517, no. 7, p. 2125.
3. Kazhukauskas, V., Garbachauskas, R., and Savitskii, S., Fiz. Tekh. Poluprovodn. (S.-Peterburg), 2018, vol. 52, no. 2, p. 171.
4. Samofalova, T.V., Semenov, V.N., Naumov, A.V., et al., Kondens.Sredy Mezhfaznye Granitsy, 2011, vol. 13, no. 4, p. 504.
5. Mayorova, T.L. and Klyuev, V.G., Semiconductors, 2009, vol. 43, no. 3, p. 292.