Effect of electric fields on the dynamics of silicon microhardness changes induced by low-intensity β irradiation-Reference-Cited by-同舟云学术

Effect of electric fields on the dynamics of silicon microhardness changes induced by low-intensity β irradiation

Published:2008-07 Issue:7 Volume:72 Page:934-936
ISSN:1062-8738
Container-title:Bulletin of the Russian Academy of Sciences: Physics
language:en
Short-container-title:Bull. Russ. Acad. Sci. Phys.

Author:

Dmitrievskii A. A.,Golovin Yu. I.,Vasyukov V. M.,Suchkova N. Yu.

Publisher

Allerton Press

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.3103/S1062873808070149.pdf

Reference5 articles.

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3. Golovin, Yu.I., Dmitrievskii, A.A., and Suchkova, N.Yu., Fiz. Tverd. Tela (St. Petersburg), 2006, vol. 48, no. 2, p. 262 [Phys. Solid State (Engl. Transl.), vol. 48, no. 2, p. 279].

4. Milevskii, L.S. and Garnyk, V.S., Fiz. Tekh. Poluprovodn. (Leningrad), 1979, vol. 13, no. 7, p. 1369 [Sov. Fiz. Semicond. (Engl. Transl.), vol. 13, no. 7, p. 801].

5. Badylevich, M.V., Blokhin, I.V., and Golovin, Yu.I., Fiz. Tekh. Poluprovodn. (St. Petersburg), 2006, vol. 40, no. 12, p. 1409 [Semiconductors (Engl. Transl.), vol. 40, no. 12, p. 1375].

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