1. Sander, D., Valenzuela, S.O., Makarov, D., et al., J. Phys. D: Appl. Phys., 2017, vol. 50, no. 36, 363001.
2. Shimizu, Y., Morimoto, S., Sanada, M., and Inoue, Y., IEEJ J. Ind. Appl., 2017, vol. 6, no. 6, p. 401.
3. Huber, C., Abert, C., Bruckner, F., et al., Appl. Phys. Lett., 2016, vol. 109, no. 16, 162401.
4. Luu, P.T., Lee, J.-Y., Kim, J.-W., et al., J. Eng. Technol., 2018, vol. 13, no. 6, p. 2329.
5. Zhou, M., Zhang, X., Zhao, W., et al., Chin. J. Electr. Eng., 2019, vol. 5, no. 4, p. 40.