X-ray emission spectroscopy of solids in the depth-resolution mode: Investigation of a-Si/Al/c-Si nanolayers-Reference-Cited by-同舟云学术

X-ray emission spectroscopy of solids in the depth-resolution mode: Investigation of a-Si/Al/c-Si nanolayers

Published:2008-04 Issue:4 Volume:72 Page:434-438
ISSN:1062-8738
Container-title:Bulletin of the Russian Academy of Sciences: Physics
language:en
Short-container-title:Bull. Russ. Acad. Sci. Phys.

Author:

Shulakov A. S.,Bukin S. V.,Zdanchuk E. V.,Tveryanovich S. Yu.

Publisher

Allerton Press

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.3103/S1062873808040047.pdf

Reference23 articles.

1. Kojnok, J., Szasz, A., Kertesz, L., and Shulakov, A.S., Phys. Status Solidi A, 1982, vol. 72, p. 131.

2. Shulakov, A.S., Nefedov, V.I., Pozdeev, P.P., et al., Poverkhnost, 1986, no. 10, p. 121.

3. Shulakov, A.S., Stepanov, A.P., Atiekh, D., et al., Fiz. Met. Metalloved., 1986, vol. 62, no. 6, p. 1136.

4. Shulakov, A.S., Stepanov, A.P., and Atiekh, D., Fiz. Tverd. Tela (St. Petersburg), 1987, vol. 29, no. 11, p. 3217 [Sov. Phys. Solid State (Engl. Transl.), vol. 29, no. 11, p. 1847].

5. Shulakov, A.S., Cryst. Res. Technol., 1988, no. 23, p. 835.

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Depth of generation of X-ray characteristic emission bands in solid targets;Physics of the Solid State;2010-09

2. XPS and depth resolved SXES study of HfO2/Si interlayers;Journal of Electron Spectroscopy and Related Phenomena;2010-08

3. Nanometer-designed Al/SiC periodic multilayers: characterization by a multi-technique approach;Surface and Interface Analysis;2010-04-22

4. Optical, chemical, and depth characterization of Al/SiC periodic multilayers;SPIE Proceedings;2009-05-07