Calculating the probability of pore formation by multicharged ions incident on an ultrathin film-Reference-Cited by-同舟云学术

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Calculating the probability of pore formation by multicharged ions incident on an ultrathin film

Published:2016-02 Issue:2 Volume:80 Page:125-128
ISSN:1062-8738
Container-title:Bulletin of the Russian Academy of Sciences: Physics
language:en
Short-container-title:Bull. Russ. Acad. Sci. Phys.

Author:

Filippov G. M.,Aleksandrov V. A.

Publisher

Allerton Press

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.3103/S1062873816020076.pdf

Reference5 articles.

1. Ritter, R., Wilhelm, R.A., Stöger-Pollach, M., et al., Appl. Phys. Lett., 2013, vol. 102, p. 063112.

2. Ritter, R., Proc. 21st Int. Conf. on Ion-Surface Interactions, Yaroslavl, 2013, vol. 2, p. 55.

3. Filippov, G.M., Nucl. Instrum. Methods Phys. Res., Sect. B, 2015, vol. 54, p. 177.

4. Landau, L.D. and Lifshitz, E.M., Quantum Mechanics, New York: Pergamon, 1976.

5. Kumar, D., Verma, V., Bhatti, K., and Dharamvir, H.S., Pramana, 2013, vol. 81, p. 1021.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Penetration of Accelerated Multivalent Ions through a System of Parallel Thin Films;Bulletin of the Russian Academy of Sciences: Physics;2018-02

2. Scattering of a particle at a crystal-structure atom;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2017-05

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