An express method of measurements of parameters of technological electron beams-Reference-Cited by-同舟云学术

An express method of measurements of parameters of technological electron beams

Published:2016-08 Issue:8 Volume:87 Page:487-492
ISSN:1068-3712
Container-title:Russian Electrical Engineering
language:en
Short-container-title:Russ. Electr. Engin.

Author:

Shcherbakov A. V.,Goncharov A. L.,Kozhechenko A. S.,Pogrebisskii M. Ya.,Rubtsov V. P.,Dragunov V. K.

Publisher

Allerton Press

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.3103/S1068371216080071.pdf

Reference10 articles.

1. Smalyuk, V.V., Diagnostika puchkov zaryazhennykh chastits v uskoritelyakh (Discharge Particles Beams in Accelerators: Diagnostics), Dikanskii, N.S., Ed., Novosibirsk: Parallel’, 2009.

2. Zuev, I.V. and Uglov, A.A., The way to measure electron beam diameter by means of rotating probe method, Fiz. Khim. Obrab. Mater., 1967, no. 5.

3. Rykalin, N.N., Zuev, I.V., and Uglov, A.A., Osnovy elektronno-luchevoi obrabotki materialov (Foundations of Electron-Beam Processing for Materials), Moscow: Mashinostroenie, 1978.

4. Akop’yants, K.S., Nazarenko, O.K., Gumovskii, V.V., and Chernyakin, V.P., Diagnostic system for electron beam in electron beam welding plants, Avtomat. Svarka, 2002, no. 10.

5. Meissner, C., Standardizing the art of electron beam welding, Sci. Techn. Rev., 2008, no. 3.

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Influence of the Thermal State of Process-Gun Elements on Electron-Optical-System Operation and Electron-Beam Parameters;Russian Electrical Engineering;2023-01

2. Investigation of the thermal state of the elements of a technological electron beam gun under long–term operating conditions;Journal of Physics: Conference Series;2021-11-01

3. Enhancement of Deposition Process Controlling in Electron Beam Metal Wire Deposition Method;IOP Conference Series: Materials Science and Engineering;2020-11-01

4. Automation of the design and development stages of semiconductor devices;IOP Conference Series: Materials Science and Engineering;2019-05-01

5. Designing Control Nodes for Mechatronic Modules by the Criterion of Minimal Losses;2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus);2019-01