1. Soldatenkov, F.Yu., Danil’chenko, V.G., and Korol’kov, V.I., FTP, 2007, vol. 41, p. 217.
2. Kuan, C.H. and Tu, C.H., J. Appl. Phys., 2000, vol. 87, p. 1836.
3. Karazhanov, S.Zh., J. Appl. Phys., 2001, vol. 89, p. 332.
4. Radchuk, N.B. and Ushakov, A.Yu., PTE, 2003, no. 3, p. 112.
5. Pavlov, L.P., Metodi izmereniya parametrov poluprovodnikovikh materialov (Methods of Measurement of Parameters of Semiconductor Materials), Moscow: Visshaya shkola, 1987.