1. Eksner, G.E., Quality and quantity surface microscopy, in Fizicheskoe metallovedenie (Physical Metallurgy), Kan, R.U. and Khaazen, P.T., Eds., Moscow: Metallurgiya, 1987, vol. 1, pp. 50–111.
2. Knechtel, H.E., Kindle, W.F., McCall, J.L., and Buchheit, R.D., Metallography, in Metallography. Tools and Techniques in Physical Metallurgy, Weinberg, F., Ed., New York: McGraw-Hill, 1970, vol. 1, pp. 329–400.
3. Binnig, G., Quate, C.F., and Gerber, Ch., Atomic force microscope, Phys. Rev. Lett., 1986, vol. 56, no. 9, pp. 930–933.
4. Mironov, V.L., Osnovy skaniruyushchei zondovoi mikroskopii (Principles of Scanning Probe Microscopy), Moscow: Tekhnosfera, 2004.
5. Lapshin, R.V., Feature-oriented scanning methodology for probe microscopy and nanotechnology, Nanotechnology, 2004, vol. 15, no. 9, pp. 1135–1151.