A Brief Comment on Atom Probe Tomography Applications-Reference-Cited by-同舟云学术

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A Brief Comment on Atom Probe Tomography Applications

Published:2016-09-30 Issue:3 Volume:46 Page:127-133
ISSN:2287-5123
Container-title:Applied Microscopy
language:en
Short-container-title:AM

Author:

Seol Jae-Bok¹,Kim Young-Tae²,Park Chan-Gyung¹²

Affiliation:

1. National Institute for Nanomaterials Technology, Pohang University of Science and Technology (POSTECH), Pohang 37673, Korea

2. Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Korea

Publisher

Korean Society of Electron Microscopy

Link

http://pdf.medrang.co.kr/KJM/2016/046/KJM046-03-02.pdf

Reference43 articles.

1. Quantitative APT analysis of Ti(C,N)

2. Evidence of lateral heat transfer during laser assisted atom probe tomography analysis of large band gap materials

3. Atomically resolved cementite dissolution governed by the strain state in pearlite steel wires

4. Atomic-scale quantification of interdiffusion and dopant localization in GeSbTe-based memory devices

5. Comparative atom probe study of Cu(In,Ga)Se2thin-film solar cells deposited on soda-lime glass and mild steel substrates

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1. Direct observation of hydrogen at defects in multicrystalline silicon;Progress in Photovoltaics: Research and Applications;2019-08-07

2. Generation of 3D representative volume elements for heterogeneous materials: A review;Progress in Materials Science;2018-07

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