Variability and Correlation Study of Growth Traits in Bread Wheat Under Non-stressed Conditions

Abstract

The morphological traits of wheat grain strongly influence on yield and directly affect the grain yield of the crop. The necessity to overcome the human demand of wheat the grain yield should be intensified. The current experiment was organized to study the morphological traits of wheat and their association with yield. The experiment was done in the randomized complete block design including three replications and twenty genotypes under normal condition in cropping season of 2021. The result of analysis of variance indicates that there is highly significant difference among the studied genotypes, traits like spikelet per spike (SPS), flag leaf area(FLA), grain yield per spike(GYS), number of grains per spike(GPS), biological yield (BY) and grain yield per plant(GYP) showed the genetic potential and variability among them. While traits plant height (PH) and peduncle length (PL) are significant. Correlation analysis showed that grain yield per plant is highly associated with flag leaf area (0.78**) followed by biological yield which is highly correlated with plant height (0.77**) and number of grain per spike was also highly correlated with spikelet per spike (0.70**).While spikelet per spike and number of grains per spike correlated non-significantly with plant height (0.21ns), (0.23ns) and biological yield correalted non-significantly with spikelet per spike (0.21ns).The highest mean values recorded by the genotype G3 for the traits SPS (21.22), PL (16.74) and BY (23.33), followed by the genotype G14 for the traits SPS (23.22), PL (17.36), FLA (15), GPS (35.83) and by the genotype G19 for the traits PH (94.63), BY (22.23), GPS (33.16). Hence, in breeding or selection program, to develop the high yield of wheat cultivars in selection or breeding program, these yield related traits should have strong and positive association.