Confidence intervals of the index $C_{pk}$ for normally distributed quality characteristics using classical and Bayesian methods of estimation

Author:

Saha Mahendra,Dey Sanku,Yadav Abhimanyu Singh,Ali Sajid

Publisher

Institute of Mathematical Statistics

Subject

Statistics and Probability

Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Improved process capability assessment through semiparametric piecewise modeling;Journal of Statistical Computation and Simulation;2024-06-25

2. Assessing high‐quality process performance using the quality‐yield index: An innovative methodology;Quality and Reliability Engineering International;2024-05-09

3. Evaluation of a novel loss-based process capacity index $${\mathcal {S}}^{\prime }_{pk}$$ and its applications;International Journal of System Assurance Engineering and Management;2024-01-17

4. Estimation of C pm for autocorrelated data in the presence of random measurement errors;Communications in Statistics - Simulation and Computation;2023-11-08

5. Applications of a new loss and cost-based process capability index to electronic industries;Communications in Statistics: Case Studies, Data Analysis and Applications;2023-09-04

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