Residual-based localization and quantification of peaks in X-ray diffractograms-Reference-Cited by-同舟云学术

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Residual-based localization and quantification of peaks in X-ray diffractograms

Published:2008-09-01 Issue:3 Volume:2 Page:
ISSN:1932-6157
Container-title:The Annals of Applied Statistics
language:
Short-container-title:Ann. Appl. Stat.

Author:

Davies P. L.,Gather U.,Meise M.,Mergel D.,Mildenberger T.

Publisher

Institute of Mathematical Statistics

Subject

Statistics, Probability and Uncertainty,Modeling and Simulation,Statistics and Probability

Link

http://projecteuclid.org/download/pdfview_1/euclid.aoas/1223908044

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