1. 1) A. R. Lang: Modern diffraction and Imaging Techniques in Material Science, eds. by Amelinckx et al., North Holland Pub., (1970), p. 407.
2. 2) B. K. Tanner: X-Ray Diffraction Topography, Pergamon Press, (1976).
3. 3) 日本結晶学会誌,特集.X線トポグラフィ,Vol. 13, No. 6(1976).
4. 4) 下村保光:X線材料強度学,養賢堂,(1973), p. 442.