1. Department of Chemical Engineering and Materials Science, Wayne State University, 5050 Anthony Wayne Dr., Detroit, MI 48202, USA, and Honeywell UOP, 25 E Algonquin Rd., Des Plaines, IL 60016, USA, https://orcid.org/0000-0001-6427-325X
2. Department of Chemical Engineering and Materials Science, Wayne State University, 5050 Anthony Wayne Dr., Detroit, MI 48202, USA (Corresponding author), e-mail: yhuang@wayne.edu