Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data-Reference-Cited by-同舟云学术

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Testing and Ranking Multiple Wafer-Manufacturing Processes With Fuzzy-Quality Data

Published:2016-02-02 Issue:5 Volume:44 Page:20150262
ISSN:0090-3973
Container-title:Journal of Testing and Evaluation
language:en
Short-container-title:J. Test. Eval.

Author:

Wu Chien-Wei¹,Liao Mou-Yuan²,Lin Chi-Wei³,Lin Tzu-Ling³

Affiliation:

1. Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu, TW.

2. Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW (Corresponding author), e-mail: myliao@pu.edu.tw

3. Dept. of Industrial Engineering and Systems Management, Feng Chia Univ., Taichung, TW.

Publisher

ASTM International

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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