Validation Technique for Heavy Vehicle Simulator Rut Measurement with Florida Laser Rut Meter-Reference-Cited by-同舟云学术

Validation Technique for Heavy Vehicle Simulator Rut Measurement with Florida Laser Rut Meter

Published:2022-12-21 Issue:4 Volume:51 Page:20220349
ISSN:0090-3973
Container-title:Journal of Testing and Evaluation
language:en
Short-container-title:J. Test. Eval.

Author:

Khan Shahbaz¹,Cotter Chris²,Greene James³

Affiliation:

1. Engineering School of Sustainable Infrastructure & Environment Weil Hall, Gainesville, FL 32611, USA (Corresponding author), e-mail: shahbaz.khan@ufl.edu, https://orcid.org/0000-0002-3484-4530

2. School of Engineering, University of North Florida, 1 UNF Dr., Skinner-Jones Hall Building 4 STE. 3201, Jacksonville, FL 32224, USA

3. State Material Office, Florida Department of Transportation, 5007, NE 39th Ave., Gainesville, FL 32609, USA

Publisher

ASTM International

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference22 articles.

1. Standard Test Method for Measuring Rut-Depth of Pavement Surfaces Using a Straightedge, ASTM 1703/E1703M-10 (West Conshohocken, PA: ASTM International, approved December 1, 2010), http://doi.org/10.1520/E1703_E1703M-10R15

2. J. S. Miller and W. Y. Bellinger, Distress Identification Manual for the Long-Term Pavement Performance Program, No. FHWA-HRT-13-092 (Washington, DC: Federal Highway Administration, Office of Infrastructure Research and Development, 2003), http://web.archive.org/web/20221012171040/https://highways.dot.gov/research/ltpp/products/distress-identification-manual-long-term-pavement-performance-program-fifth-revised-edition.

3. Influence of Computation Algorithm on the Accuracy of Rut Depth Measurement;Wang;Journal of Traffic and Transportation Engineering,2017

4. A Comprehensive System for AASHTO PP69-10-Based Pavement Rut Evaluation Using 1-mm 3D Pavement Surface Model;Qiu;International Journal of Pavement Engineering,2016

5. Line-Laser-Based Visual Measurement for Pavement 3D Rut Depth in Driving State;Hong;Electronics Letters,2018