An Investigation of the Non-selective Etching of Synthetic Polymers by Electrospray Droplet Impact/Secondary Ion Mass Spectrometry (EDI/SIMS)
Author:
Affiliation:
1. Clean Energy Research Center, University of Yamanashi
2. Department of Molecular Microbiology & Immunology, Johns Hopkins Bloomberg School of Public Health, Johns Hopkins University
Publisher
The Mass Spectrometry Society of Japan
Subject
Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics
Link
https://www.jstage.jst.go.jp/article/massspectrometry/12/1/12_A0114/_pdf
Reference35 articles.
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2. 2) R. J. Beuhler, L. Friedman. Mass distribution of ions sputtered by cluster impacts on carbon, copper and gold targets. Int. J. Mass Spectrom. Ion Process. 94: 25–39, 1989.
3. 3) A. D. Appelhans, J. E. Delmore. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics. Anal. Chem. 61: 1087–1093, 1989.
4. 4) T. J. Colla, R. Aderjan, R. Kissel, H. M. Urbassek. Sputtering of Au (111) induced by 16-keV Au cluster bombardment: Spikes, craters, late emission, and fluctuations. Phys. Rev. B Condens. Matter Mater. Phys. 62: 8487–8493, 2000.
5. 5) B. J. Garrison, A. Delcorte, K. D. Krantzman. Molecule liftoff from surfaces. Acc. Chem. Res. 33: 69–77, 2000.
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