Gas electron diffraction of increased performance through optimization of nozzle, system design and digital control

Author:

Reuter Christian G.1,Vishnevskiy Yury V.1,Blomeyer Sebastian1,Mitzel Norbert W.1

Affiliation:

1. Chair of Inorganic and Structural Chemistry, Faculty of Chemistry and Center for Molecular Materials CM 2 , Bielefeld University, Universitätsstraße 25, D-33615 Bielefeld, Germany

Abstract

Abstract A number of measures to increase the quality of data recorded with an improved Balzers Eldigraph KD-G2 gas-phase electron diffractometer are discussed. The beam-stop has been decoupled from the sector enabling us recording the current of the primary beam and scattered electrons during the experiment. Different beam-stops were tested for use in the present setup. Modifications of the nozzle tip of an earlier described medium temperature nozzle are reported. The measures lead to reduced exposure times and reduced amount of sample necessary for complete data collection.

Publisher

Walter de Gruyter GmbH

Subject

General Chemistry

Reference29 articles.

1. C. Davisson, L. H. Germer, Nature1927, 119, 558.

2. H. Mark, R. Wierl, Z. Elektrochem. Angew. Phys. Chem.1930, 36, 675.

3. Active laboratories for electron diffraction are at the following universities: Bielefeld (Germany), Corvallis (Oregon, US), Ivanovo (Russia), Moscow State, Moscow (Russia), York (UK), Christchurch (New Zealand), Sapporo/Tokio (Japan).

4. W. Zeil, J. Haase, L. Wegmann, Z. Instr.1966, 74, 84.

5. R. J. F. Berger, N. W. Mitzel, M. Hoffmann, S. A. Hayes, Z. Naturforsch.2009, 64b, 1259.

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