The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs-Reference-Cited by-同舟云学术

The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

Published:2015-09-01 Issue:3 Volume:22 Page:455-464
ISSN:2300-1941
Container-title:Metrology and Measurement Systems
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Author:

Górecki Krzysztof,Górecki Paweł

Abstract

Abstract In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.

Publisher

Walter de Gruyter GmbH

Link

https://www.degruyter.com/view/j/mms.2015.22.issue-3/mms-2015-0036/mms-2015-0036.pdf

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