High-temperature diffraction experiments and phase diagram of ZrO2 and ZrSiO4

Abstract

Abstract High-temperature X-ray diffraction (XRD) experiments up to T = 2710 °C have been performed on ZrSiO4 and ZrO2 powders, using the container-less levitation technique. A two-dimensional imaging plate (IP) detector was used for short-time observation. The diffraction data in a wide area was projected in one dimension. The unit cell parameters, thermal expansions, and c/a ratios for ZrSiO4 (space group I41/amd and Z = 4), tetragonal ZrO2 (space group P42/nmc and Z = 2) and cubic ZrO2 (space group  F m 3   ‾ m $Fm3‾{}m$ and Z = 4) were measured to understand the high-temperature behaviors. The transition temperature between tetragonal and cubic ZrO2 was specified to be between 2430 and 2540 °C. The pre-transitional behavior was observed around 2200 °C. As no clear change in unit cell volume is evident, the phase boundary between the tetragonal and the cubic phase has been shown to be a positive slope. The ZrO2 and ZrO2–SiO2 phase diagrams are proposed based on the chemical composition and the crystal structure.