Nahordnung in binären Schmelzen und Mischkristallen / Short Range Order in Binary Melts and Binary Solid Solubilities

Author:

Boos Alfred1,Lamparter Peter1,Steeb Siegfried1

Affiliation:

1. Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, Stuttgart, BRD

Abstract

Abstract The X-Ray or neutron-intensity scattered from binary melts can be described in a similar way as that from a binary solid solution, namely as a sum of three contributions. One of these contributions describes the short range order scattering which consists of small angle scattering for segregated melts and which leads to premaxima for melts containing compound-like agglomerates. A method is shown to reveal the short range order parameter for the so-called simple model of the melts. A second method leads to the evaluation of the concentration of the agglomerates existing in com­ pound-forming melts for the so-called refined model of the melts.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics

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