Enhanced interface structure of electroformed copper/diamond composites for thermal management applications
Author:
Affiliation:
1. Turkish-German University, Department of Materials Science and Technology , Beykoz , Istanbul , Türkiye
2. Istanbul Technical University, Department of Metallurgical and Materials Engineering , Maslak , Istanbul , Türkiye
Abstract
Funder
Scientific Research Projects Department of Istanbul Technical University
Publisher
Walter de Gruyter GmbH
Link
https://www.degruyter.com/document/doi/10.1515/mt-2023-0236/pdf
Reference31 articles.
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2. I. Ferain, C. A. Colinge, and J. P. Colinge, “Multigate transistors as the future of classical metal-oxide-semiconductor field-effect transistors,” Nature, vol. 479, no. 7373, pp. 310–316, 2011. https://doi.org/10.1038/nature10676.
3. S. V. Kidalov and F. M. Shakhov, “Thermal conductivity of diamond composites,” Materials, vol. 2, no. 4, pp. 2467–2495, 2009, https://doi.org/10.3390/ma2042467.
4. P. Jacobson and S. Stoupin, “Thermal expansion coefficient of diamond in a wide temperature range,” Diamond Relat. Mater., vol. 97, 2019, no. 107469, https://doi.org/10.1016/j.diamond.2019.107469.
5. E. Kondakci and N. Solak, “Enhanced thermal conductivity and long-term stability of diamond/aluminum composites using SiC-coated diamond particles,” J. Mater. Sci., vol. 57, no. 5, pp. 3430–3440, 2022. https://doi.org/10.1007/s10853-021-06817-x.
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