Analysis of surface properties of semiconducting (Ti,Pd,Eu)Ox thin films

Author:

Wojcieszak D.,Kaczmarek D.,Domaradzki J.

Abstract

In this paper an analysis of the surface properties of (Ti,Pd,Eu)O

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Radiation,General Materials Science

Reference13 articles.

1. TiO thin films moped with Pd and Eu for optically and electrically active TOS Si heterojunctions;Kaczmarek;Opt Mat,2009

2. Visible and near IR lumines cence via energy transfer in rare earth doped mesoporous ti tania thin films with nanocrystalline walls;Frindell;St Chem,2003

3. Influence of annealing temperature on the properties of tita nium oxide thin film;Hou;Appl Surf Sci,2003

4. ro A soft ware for scanning probe microscopy and a tool for nanotech nology;Horcas;Rev Sci Instrum,2007

5. Powłoki optyczne na bazie TiO Oficyna Wydawnicza Politechniki Wroc IN PO The role of metal ion dopants in quantum sized TiO Correlation between photoreactivity and charge carrier recombination dynamics;Domaradzki;Phys Chem,2010

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