Influence of a thin dielectric layer on resonance frequencies of square SRR metasurface operating in THz band

Author:

Lopato Przemyslaw1,Herbko Michal1,Mescheder Ulrich2,Kovacs Andras2

Affiliation:

1. Center for Electromagnetic Fields Engineering and High Frequency Techniques, Faculty of Electrical Engineering, West Pomeranian University of Technology , Szczecin , Poland

2. Institute of Microsystems Technology (iMST), Furtwangen University , Furtwangen im Schwarzwald , Germany

Abstract

Abstract This article investigates the effect of an additional thin dielectric layer on the top of the metasurface (MS), on the transmission of electromagnetic waves in the terahertz band. For this purpose, the split ring resonator-based MS was designed and analyzed in the terahertz band. The influence of permittivity, film thickness, and suspension height on S 21 transmission coefficient characteristics was studied. For this purpose, a numerical model was created and solved using the finite element method. The conducted study can be helpful in three cases. First, changing the suspension height of the dielectric layer may allow tunable MSs using MEMS structures. Also, this research can be used to determine the effect of applying an additional layer of protection when using the MS as a sensor to test substances that can damage it. In addition, there is an opportunity to study the dielectric properties of thin films using the proposed MS.

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Aerospace Engineering,General Materials Science,Civil and Structural Engineering,Environmental Engineering

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