Voltage-Induced Cholesteric Structure-Transformation in Thin Layers

Abstract

Abstract o lta g e -In d u c e d C h o le s te r ic S tr u c tu r e -T r a n s f o r m a tio n in T h i n L a y e rs Measurements of various threshold voltages which occur in thin layers of cholesteric liquid crystals with positive dielectric anisotropy under homeotropic wall-alignment conditions are presented. Characteristic times are determined for some of the structure-changing processes which take place under application of electric-field changes. The measurements have been performed for various pitch-to-thickness ratios, and are expressed in empirical formulae.