Second order reflection from crystals used in soft X-ray spectroscopy
Affiliation:
1. Institute of Physics, Opole University, 48 Oleska Str., 45-052 Opole, Poland, Tel.: +48 77 452 7263, Fax: +48 77 452 7290
Abstract
Abstract
In this note the ratio of the second to the first order reflection is determined for the KAP and PbSt crystals, for wavelengths corresponding to the Al K-line emission. The source of the radiation was a low-voltage stabilized X-ray tube. The X-rays were detected with a Bragg spectrometer equipped with a proportional counter detector. The signal measured by the proportional counter was subsequently pulse height analyzed.
Publisher
Walter de Gruyter GmbH
Subject
Waste Management and Disposal,Condensed Matter Physics,Safety, Risk, Reliability and Quality,Instrumentation,Nuclear Energy and Engineering,Nuclear and High Energy Physics